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Conference Chair S.-W. Kim, Korea Advanced Institute for Science and Technology (KAIST), Korea Steering Committee K. C. Fan, National Taiwan University, Taiwan Y. Gao, Hong Kong University of Science and Technology, Hong Kong (China) W. Gao, Tohoku University, Japan G. Jager, Technical University Ilmenau, Germany X. Q. Jiang, University of Huddersfield, UK G. F. Jin, Tsinghua University, China Z. Li, Huazhong University of Science and Technology, China P. H. Osanna, Vienna University of Technology, Austria H. J. Pahk, Seoul National University, Korea K. Sapozhnikova, D.I.Mendeleyev Institute for Metrology, Russia M. Sawabe, Mitutoyo Corporation, Japan J. Song, National Institute of Standards and Technology, USA J. B. Tan, Harbin Institute of Technology, China K. Takamasu, University of Tokyo, Japan R. Taymanov, D.I.Mendeleyev Institute for Metrology, Russia A. A. Weckenmann, University Erlangen-Nuremberg, Germany D. J. Whitehouse, University of Warwick, UK S. Z. A. Zahwi, National Institute for Standards, Egypt G. X. Zhang, Tianjin University, China International Program Committee O. Abouelatta, Mansoura University, Egypt H. Bosse, Physikalisch Technische Bundesanstalt, Germany P. Cai, Shanghai Jiao Tong University, China L. C. Chen, National Taipei University of Technology, Taiwan I. Dudas, University of Miskolc, Hungary N. Durakbasa, Vienna University of Technology, Austria R. Furutani, Tokyo Denki University, Japan H. Haitjema, Mitutoyo Research Center Europe B. V., The Netherland V. Hans, University of Essen, Germany H. N. Hansen, Technical University of Denmark, Denmark R. J. Hocken, University of North Carolina at Charlotte, USA W. H. Huang, University of Science and Technology of China, China S. E. Hussein, Mansoura University, Egypt R. Jablonski, Warsaw University of Technology, Poland S. C. Kim, Chungbuk National University, Korea M. Krystek, PTB, Germany S. Kurokawa, Kyusyu University, Japan R. Leach, National Physical Laboratory, UK Z. Li, Huazhong University of Science and Technology, China S. F. Ling, Nanyang Technological University, Singapore X. Liu, University of Warwick, UK P. Rolfe, OBH Ltd., UK K. Sapozhnikova, D.I.Mendeleyev Institute for Metrology, Russia R. Schmitt, RWTH Aachen University, Germany H. Schweinzer, Vienna University of Technology, Austria Z. Shi, Beijing University of Technologym, China A. Shimokohbe, Tokyo Institute of Technology, Japan F. J. Shiou, National Taiwan University of Science and Technology, Taiwan Y. Takaya, Osaka University, Japan R. Taymanov, D.I.Mendeleyev Institute for Metrology, Russia G. Varga, University of Miskolc, Hungary C. P. Wang, Optodyne Inc, USA T. Watanabe, Heidenhain K.K., Japan L. J. Zeng, Tsinghua University, China S. L. Zhang, Tsinghua University, China J. G. Zhou, Drexel University, USA Publication Committee S.W. Kim, KAIST, Korea Y. Gao, Hong Kong University of Science and Technology, Hong Kong (China) K. C. Fan, National Taiwan University, Taiwan W. Gao, Tohoku University, Japan V. Hans, University of Essen, Germany Local Organizing Committee S.-W. Kim, Korea Advanced Institute for Science and Technology (KAIST), Korea J. Chu, Samsung Electronics, Korea Y.-S. Ghim, Samsung Electro-mechanics, Korea S.-W. Hong, Kumoh National Institute of Technology, Korea J. Hwang, Korea Institute of Machinery and Materials, Korea J. Jin, Korea Research Institute of Standards and Science, Korea T. Keem, Samsung Corning Precision Materials, Korea B.-C. Kim, Kyungnam University, Korea J. Kim, Korea Advanced Institute for Science and Technology (KAIST), Korea H.-J. Lee, Korea Institute of Industrial Technology, Korea H. S. Lee, Nano System, Korea C. H. Lee, Korea Institute of Machinery and Materials, Korea J.-S. Oh, Korea Institute of Machinery and Materials, Korea C. H. Park, Korea Institute of Machinery and Materials, Korea J. Yoo, Intek Plus, Korea |
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